Proposal of Japan concerning extension of CIA focus
{"Image DocumentName": "Proposal of Japan concerning extension of CIA focus", "Image ImageDescription": "What to do? Establish a better balance of defect/contamination detection and fault diagnostics/ control of electrical characteristics in CIA focus. Include statistical/ systematic approach into YE activities. Include device/ chip/ system level tables and requirements into ITRS2013 YE chapter. Why? Extra/ Missing materials are root cause of yield excursion. \uf0e0 Physical inspection often requires intensive efforts. \uf0e0 Such faults are more easily approached by detection of abnormal device behaviour/ chip malfunction manifesting itself in out-of-spec electrical parameters.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}