Interference Microscopy Instrument. Interference technique. Computational process. VSI mode. PSI mode. Angle of acceptance. Terraced surface vs. rough
{"Image DocumentName": "Interference Microscopy", "Image ImageDescription": "Visible wavelength optical microscope. Also called Non-contact Profilometry. Nanometer resolution vertical to surface. Uses interferometry to measure surface profile. Large dynamic range. The IM is an excellent microscopical tool. It has the vertical resolution of an SFM with a dynamic range that greatly exceeds the probe microscopes. Instrument. Interference technique. Computational process. VSI mode. PSI mode. Angle of acceptance. Terraced surface vs. rough surfaces.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}