Applying bias to a metal-semiconductor junction, cont
{"Image DocumentName": "Applying bias to a metal-semiconductor junction, cont", "Image ImageDescription": "\u2022 Currents. Note: the barrier seen by electrons in the metal does not. change with bias, whereas the barrier seen by those in. the semiconductor does. Thus the carrier flux (current) we focus on is that of majority. carriers from the semiconductor flowing into the metal. Metal-semiconductor junctions are primarily majority. carrier devices. Minority carrier injection into the semiconductor can usually. be neglected; more about this later.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}