4 24 July 2002 Work In Progress – Not for Publication 2001 ITRS Yield Enhancement US Domestic TWG Membership Yield Model and Defect Budget –Honey Goel - Chair (TI) –Darren Dance (WWK) –Dan Maynard (IBM) –Mel Effron (HPL) –Manuela Huber (Infineon) Defect Detection and Characterization –Mike Retersdorf – Chair (AMD) –Bob Bryant (n-Line) –Walt Gardner (ORNL) –Paul Jones (n-Line) –Matthew Sbragia (TSK) –Rick Jarvis – Chair (AMD) Yield Learning –Fred Lakhani – Chair (ISMT) –Hank Walker (Texas A+M) –Ken Tobin (ORNL) –Dave Chamness (Agilent) –Mike McIntyre (AMD) Wafer Environment Contamination Control –Chris Long – Chair (IBM) –Bill Fil (IBM) –Ralph Richardson (Air Products) –Dianne Dougherty (ChemTrace) –James McAndrew (AirLiquide) –Michael Patterson (Intel) –Jeff Chapman (IBM)
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