Overview Motivation Introduction CMOS v/s CNTFETs CNT Technology – Challenges Probabilistic model of faults Modelling performance parameters: I ON / I
{"Image DocumentName": "Overview Motivation Introduction CMOS v/s CNTFETs", "Image ImageDescription": "CNT Technology \u2013 Challenges. Probabilistic model of faults. Modelling performance parameters: ION / IOFF tuning ratio. Gate delay. Noise Margin. Conclusion. 04/29/2014.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}