Scope of RAM Testing Parametric Test: DC & AC Reliability Screening
{"Image DocumentName": "Scope of RAM Testing Parametric Test: DC & AC Reliability Screening", "Image ImageDescription": "Long-cycle testing. Burn-in: static & dynamic BI. Functional Test. Device characterization. Failure analysis. Fault modeling. Simple but effective (accurate & realistic?) Test algorithm generation. Small number of test patterns (data backgrounds) High fault coverage. Short test time. mbist1.10. Cheng-Wen Wu, NTHU.", "Image XResolution": "37", "Image YResolution": "37", "Image ResolutionUnit": "Pixels/Centimeter", "Image Software": "SlidePlayer", "Image YCbCrPositioning": "Centered"}